The PAS-301 Pretilt Analysis
System is a research and development tool designed to provide an
affordable means for determining the pretilt of antiparallel and TN liquid
crystal test cells.
Pretilt is a critical
physical parameter for liquid crystal displays (LCDs). Without pretilt,
transient and permanent defects in the orientation of the liquid crystal
degrade the optical and switching performance of the LC cell. These
defects lead to poorer contrast, brightness and viewing angles.
LCD manufacturers evaluate
and test many new alignment polymers and liquid crystals for LCDs. The
type of alignment polymer and liquid crystal can have a dramatic effect on
the pretilt of the liquid crystal display and, therefore, manufacturers
monitor pretilt as part of their evaluation. It was for this purpose that
the PAS-301 was designed and engineered.
The PAS-301 Pretilt Analysis
System can be used with antiparallel, TN, and VA test cells. PASS
acquisition and analysis software for the Windows operating system
collects and processes the data in less than 1 minute. The system includes
a reference sample for independent confirmation of system performance. The
compact footprint of the PAS-301 makes the system ideal for environments
with space limitations.
Elsicon is currently
marketing the PAS-301 Pretilt Analysis System. If you are interested in
discussing your pretilt measurement needs please contact the
representative listed below.
General Specifications
Control Interface: Notebook computer with Windows operating system
and A/D card
Digitization: 12-bit resolution, PCMCIA Type II compatible
Cell Geometry: TN or antiparallel, > 3mm gap for TN, > 10mm gap for
antiparallel
Max. Cell/LCD Size: Approx. 200mmX200mm; Approx. 100mmX100mm for
complete mapping of pretilt over the area of the cell/LCD
Throughput: Less than 1 minute per cell for acquisition, analysis
and display
Pretilt Evaluation: Near planar (Approx. 0o - 25o)and homeotropic
(Approx. 70o - 90o) measurements, fitting of numerical models to digitized
data
Reference Sample: MgF2 reference crystal for independent testing of
system performance
PAS-301 Optical
Specifications
Optical Source: Automatic power stabilized laser diode, 635nm
wavelength, < 0.5mm spot size
Polarization: Selectable polarizer and analyzer for TN or
antiparallel cell configurations
Rotation: Computer controlled, 140o scan @ 10o/sec, 0.01o
resolution, automatic determination of normal incidence direction
Detection: Amplified silicon photodetector
Optical Enclosure Dimensions: Height: 38 cm, Length: 45cm, Width:
38cm
Optical Enclosure Weight: Approx. 25Kg
PASS Acquisition and
Analysis Software
Platform: PC Windows operating system
Features: Instrument control, data acquisition, automated and
manual numerical fitting with 32 bit code, document storage and retrieval,
experimental and numerical data exporting and importing capabilities
Cell Gap: Analysis of empty cell transmission as a function of
angle can be used to determine cell gap via a fast FFT algorithm (Approx.
3 - 25mm)
System Requirements
Voltage Requirements: 100-120VAC, 50-60Hz, single phase
Specifications subject to change without notice. dows
Contacts:
Wayne M.Gibbons
Elsicon, Inc.
Tel:(302)266-7030 ext.11
Fax:(302)266-7031
Email:wmgibbons@elsicon.com
For Japan:
Mr.Masaru Inoue
Toyo Corporation
1-6,Yaesu1-chome,Chuo-ku,
Tokyo103-8284Japan
Tel:81-(0)3-3245-1242
www.toyo.co.jp
Last updated
9/28/06